Approximate Multipliers Using Static Segmentation: Error Analysis and Improvements
A.G.M. Strollo, Ettore Napoli, Davide De, Nicola Petra, Gerardo Saggese, Gennaro Di Meo
Abstract
Approximate multipliers are used in error-tolerant applications, sacrificing the accuracy of results to minimize power or delay. In this paper we investigate approximate multipliers using static segmentation. In these circuits a set of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$m$ </tex-math></inline-formula> contiguous bits (a segment of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$m$ </tex-math></inline-formula> bits) is extracted from each of the two <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$n$ </tex-math></inline-formula> -bits operand, the two segments are in input to a small <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$m\times m$ </tex-math></inline-formula> internal multiplier whose output is suitably shifted to obtain the result. We investigate both signed and unsigned multipliers, and for the latter we propose a new segmentation approach. We also present simple and effective correction techniques that can significantly reduce the approximation error with reduced hardware costs. We perform a detailed comparison with previously proposed approximate multipliers, considering a hardware implementation in 28 nm technology. The comparison shows that static segmented multipliers with the proposed correction technique have the desirable characteristic of being on (or close to) the Pareto-optimal frontier for both power vs normalized mean error distance and power vs mean relative error distance trade-off plots. These multipliers, therefore, are promising candidates for applications where their error performance is acceptable. This is confirmed by the results obtained for image processing and image classification applications.