Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
Mario Lanza, Quentin Smets, Cedric Huyghebaert, Lain‐Jong Li
Abstract
The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
Topics & Concepts
Reliability (semiconductor)BenchmarkingYield (engineering)Stability (learning theory)ElectronicsComputer scienceReliability engineeringNanotechnologyMaterials scienceEngineeringElectrical engineeringMachine learningBusinessPhysicsMarketingPower (physics)Quantum mechanicsMetallurgyFerroelectric and Negative Capacitance DevicesAdvancements in Semiconductor Devices and Circuit DesignAdvanced Memory and Neural Computing