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Atomic-scale insights into the material removal mechanism of cerium oxide polished fused silica based on ReaxFF-MD

Fukun Li, Bai Yang, Haixiang Hu, Longxiang Li, Feng Zhang, Xiao Luo, Xuejun Zhang

2024Journal of Manufacturing Processes19 citationsDOI

Topics & Concepts

Materials scienceReaxFFCerium oxideAtomic unitsCeriumOxideNanometreChemical engineeringComplex oxideMechanism (biology)MetallurgyComposite materialMolecular dynamicsComputational chemistryChemistryPhilosophyEngineeringInteratomic potentialQuantum mechanicsPhysicsEpistemologyDiamond and Carbon-based Materials ResearchRadioactive element chemistry and processingIon-surface interactions and analysis
Atomic-scale insights into the material removal mechanism of cerium oxide polished fused silica based on ReaxFF-MD | Litcius