Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation
P. Sarazá-Canflanca, H. Carrasco-Lopez, A. Santana-Andreo, Piedad Brox, R. Castro‐López, E. Roca, F.V. Fernández
Topics & Concepts
Degradation (telecommunications)Reliability engineeringReliability (semiconductor)Static random-access memoryAccelerated agingComputer scienceMaterials scienceElectronic engineeringEngineeringComputer hardwarePhysicsThermodynamicsPower (physics)Physical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisSemiconductor materials and devices