Analytical Design of Dual-Band Negative Group Delay Circuit With Multi-Coupled Lines
Xiang Zhou, Binhong Li, Ningdong Li, Blaise Ravelo, Xiaofeng Hu, Qizheng Ji, Fayu Wan, Glauco Fontgalland
Abstract
This paper develops an innovative design method of a multi-coupled line (CL) topology of low-loss dual band negative group delay (NGD) circuit. The proposed is conceived using three transmission lines (TLs) with different length in which integrate two couplers. The three traveling paths are designed to generate the dual-band NGD effect, where the CLs allow lowering the signal attenuation. The NGD circuit S-parameter model as a function of the TLs physical lengths and coupling coefficient are established. To validate the NGD circuit proof-of-concept, it is fabricated and measured. The NGD values of approximately -4.06 ns and -3.83 ns are measured at center frequencies of 2.43 GHz and 3.02 GHz, respectively. The measured transmission coefficient is better than -2.9 dB and the measured reflection one is better than -12 dB into the NGD band. The measurement results of the NGD circuit are in good agreement with the simulations results.