Synthetic data augmentation for surface defect detection and classification using deep learning
Saksham Jain, Gautam Seth, Arpit Paruthi, Umang Soni, Girish Kumar
Topics & Concepts
Computer scienceArtificial intelligenceConvolutional neural networkPipeline (software)Synthetic dataDeep learningMachine learningPattern recognition (psychology)Sensitivity (control systems)Representation (politics)Noise (video)Domain (mathematical analysis)Generator (circuit theory)Image (mathematics)Power (physics)MathematicsLawElectronic engineeringPolitical scienceEngineeringMathematical analysisPoliticsQuantum mechanicsPhysicsProgramming languageIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure Analysis