Probing the edge states of Chern insulators using microwave impedance microscopy
Taige Wang, Chen Wu, Masataka Mogi, Minoru Kawamura, Yoshinori Tokura, Zhi‐Xun Shen, Yi‐Zhuang You, Monica Allen
Abstract
Quantum anomalous Hall (QAH) insulators, known for their topological 1D conducting edge states, are a focus of many recent quantum material studies. Here, the authors overcome the challenges in direct imaging and analysis of edge states by exploiting the power of microwave impedance microscopy (MIM). By analyzing the resonance pattern of 1D edge plasmon excitations, MIM can discern true topological edge states from potential trivial ones. This approach significantly advances our understanding of QAH insulators and their topological edge states.
Topics & Concepts
Topological insulatorEnhanced Data Rates for GSM EvolutionMicrowavePlasmonPhysicsCondensed matter physicsQuantumFocus (optics)OptoelectronicsQuantum mechanicsOpticsTelecommunicationsComputer scienceTopological Materials and PhenomenaQuantum and electron transport phenomenaGraphene research and applications