Optical and Structural characterization of spraying ZrO2 and doped B: ZrO2 thin films
Shawki K Muhammad, Mohammed O. Dawood, Nagham Yassin Ahmed, Ehssan S. Hassan, Nadir Fadhil Habubi, Sami Salman Chiad
Abstract
Abstract Zirconium oxide (ZrO 2 ) and doped with boron (B) thin films were prepared by Chemical spray pyrolysis CSP. Optical band gap energy of the films decreased from 3.83 to 3.73.55 eV via increase of doping. X-XRD patterns disclosed that films structure were polycrystalline, mixture of monoclinic and tetragonal phases. Atomic force microscopy (AFM) results assure dependence of surface morphology and roughness upon doping.
Topics & Concepts
Materials scienceDopingTetragonal crystal systemThin filmCrystalliteMonoclinic crystal systemBand gapAtomic force microscopySpray pyrolysisZirconiumBoronCharacterization (materials science)Chemical engineeringOxideNanotechnologyCrystallographyCrystal structureOptoelectronicsChemistryMetallurgyOrganic chemistryEngineeringSemiconductor materials and devicesElectronic and Structural Properties of OxidesGa2O3 and related materials