Degradation path approximation for remaining useful life estimation
Linchuan Fan, Wen‐Yi Lin, Xiaolong Chen, Hongpeng Yin, Yi Chai
Topics & Concepts
InterpretabilityDegradation (telecommunications)Computer sciencePath (computing)Compensation (psychology)Reliability engineeringMachine learningData miningArtificial intelligenceEngineeringPsychoanalysisPsychologyProgramming languageTelecommunicationsReliability and Maintenance OptimizationMachine Fault Diagnosis TechniquesAdvanced Battery Technologies Research