Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy
Bernard Ouma Alunda, Yong Joong Lee
Abstract
This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring-mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.
Topics & Concepts
CantileverAtomic force microscopyNanotechnologyKelvin probe force microscopeMicroscopyMaterials scienceComputer sciencePhysicsOpticsComposite materialForce Microscopy Techniques and ApplicationsMechanical and Optical ResonatorsAnalytical Chemistry and Sensors