A reliable, multi-bit error tolerant 11T SRAM memory design for wireless sensor nodes
Vishal Sharma, Neha Gupta, Ambika Prasad Shah, Santosh Kumar Vishvakarma, Shailesh Singh Chouhan
Topics & Concepts
Static random-access memoryComputer scienceRobustness (evolution)Error detection and correctionOverhead (engineering)Soft errorReliability (semiconductor)Electronic engineeringComputer hardwareEmbedded systemPower (physics)EngineeringAlgorithmChemistryQuantum mechanicsPhysicsBiochemistryGeneOperating systemLow-power high-performance VLSI designAdvanced Memory and Neural ComputingRadiation Effects in Electronics