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Deep Neural Networks for Analysis of Microscopy Images—Synthetic Data Generation and Adaptive Sampling

Patrick Trampert, Dmitri Rubinstein, Faysal Boughorbel, Christian Schlinkmann, Maria Luschkova, Philipp Slusallek, Tim Dahmen, Stefan Sandfeld

2021Crystals38 citationsDOIOpen Access PDF

Abstract

The analysis of microscopy images has always been an important yet time consuming process in materials science. Convolutional Neural Networks (CNNs) have been very successfully used for a number of tasks, such as image segmentation. However, training a CNN requires a large amount of hand annotated data, which can be a problem for material science data. We present a procedure to generate synthetic data based on ad hoc parametric data modelling for enhancing generalization of trained neural network models. Especially for situations where it is not possible to gather a lot of data, such an approach is beneficial and may enable to train a neural network reasonably. Furthermore, we show that targeted data generation by adaptively sampling the parameter space of the generative models gives superior results compared to generating random data points.

Topics & Concepts

Computer scienceArtificial intelligenceConvolutional neural networkArtificial neural networkParametric statisticsSynthetic dataSegmentationDeep learningParametric modelAdaptive samplingMachine learningGeneralizationPattern recognition (psychology)Process (computing)Sampling (signal processing)Generative modelGenerative grammarComputer visionMathematicsMonte Carlo methodFilter (signal processing)Mathematical analysisOperating systemStatisticsMachine Learning in Materials ScienceCell Image Analysis TechniquesAdvanced Electron Microscopy Techniques and Applications