Exploring performance degradation of quantum-dot light-emitting diodes
Aqiang Liu, Chunyan Cheng, Jianjun Tian
Abstract
We constructed an in situ electrical and optical monitoring system to clarify the degradation of QLEDs. The result reveals that performance degradation originates from electrochemical reduction of the hole transport layer.
Topics & Concepts
Degradation (telecommunications)Materials scienceQuantum dotOptoelectronicsDiodeLayer (electronics)ElectrochemistryLight-emitting diodeReduction (mathematics)In situNanotechnologyElectrodeComputer scienceTelecommunicationsMeteorologyPhysicsGeometryMathematicsQuantum mechanicsQuantum Dots Synthesis And PropertiesChalcogenide Semiconductor Thin FilmsSemiconductor materials and devices