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Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application

Younes Boussadi, N. Rochat, Jean‐Paul Barnes, Badhise Ben Bakir, Philippe Ferrandis, Bruno Masenelli, Christophe Licitra

2021Journal of Luminescence71 citationsDOI

Topics & Concepts

CathodoluminescenceOptoelectronicsPhotoluminescencePassivationReactive-ion etchingMaterials scienceEtching (microfabrication)LuminescenceIonSecondary ion mass spectrometryAnalytical Chemistry (journal)ChemistryNanotechnologyChromatographyLayer (electronics)Organic chemistryGaN-based semiconductor devices and materialsSemiconductor materials and devicesThin-Film Transistor Technologies
Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application | Litcius