Atomic layer deposition and characterization of Bi1Se1 thin films
Shiyang He, Amin Bahrami, Xiang Zhang, Magdalena Ola Cichocka, Jun Yang, Jaroslav Charvot, Filip Bureš, Alla Heckel, Stephan Schulz, Kornelius Nielsch
Topics & Concepts
Materials scienceCrystallinityRaman spectroscopyAtomic layer depositionDeposition (geology)X-ray photoelectron spectroscopyBismuthAnalytical Chemistry (journal)Thin filmMicrostructureCharacterization (materials science)SelenideGrain sizeLayer (electronics)Chemical engineeringMineralogyNanotechnologyMetallurgyChemistryComposite materialOpticsPhysicsSedimentSeleniumChromatographyEngineeringPaleontologyBiology2D Materials and ApplicationsAdvanced Thermoelectric Materials and DevicesMXene and MAX Phase Materials