Litcius/Paper detail

In-Situ Monitoring for Defect Identification in Nickel Alloy Complex Geometries Fabricated by L-PBF Additive Manufacturing

J. Logan McNeil, Kevin Sisco, Curt Frederick, Michael Massey, K. Carver, Fred List, Caian Qiu, M. Mäder, Suresh Sundarraj, S. S. Babu

2020Metallurgical and Materials Transactions A39 citationsDOI

Topics & Concepts

SuperalloyMaterials scienceIn situAlloyLayer (electronics)ThermalRaster graphicsNickelRaster scanFusionLaserNickel alloyHeat transferIntensity (physics)Composite materialOpticsMetallurgyComputer scienceChemistryMechanicsPhysicsThermodynamicsOrganic chemistryLinguisticsPhilosophyArtificial intelligenceAdditive Manufacturing Materials and ProcessesAdditive Manufacturing and 3D Printing TechnologiesWelding Techniques and Residual Stresses
In-Situ Monitoring for Defect Identification in Nickel Alloy Complex Geometries Fabricated by L-PBF Additive Manufacturing | Litcius