Influence of neutron radiation on majority and minority carrier traps in n-type 4H-SiC
Ivana Capan, Tomislav Brodar, Yuichi Yamazaki, Yuya Oki, Takeshi Ohshima, Yoji Chiba, Yasuto Hijikata, Luka Snoj, Vladimir Radulović
2020Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms32 citationsDOIOpen Access PDF
Topics & Concepts
Deep-level transient spectroscopyMaterials scienceAtomic physicsConduction bandVacancy defectElectronSiliconIrradiationPenning trapNeutronCondensed matter physicsNuclear physicsPhysicsOptoelectronicsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesSilicon and Solar Cell Technologies