Failure investigation of buffer layers in high-voltage XLPE cables
Yun Chen, Baojun Hui, Yanting Cheng, Yanpeng Hao, Mingli Fu, Lin Yang, Shuai Hou, Licheng Li
Topics & Concepts
Materials scienceElectrical treeingCorrosionComposite materialCopperBuffer (optical fiber)Layer (electronics)Failure mechanismOptical microscopeElectrodeMetallurgyForensic engineeringPartial dischargeVoltageScanning electron microscopeElectrical engineeringChemistryPhysical chemistryEngineeringHigh voltage insulation and dielectric phenomenaElectrostatic Discharge in ElectronicsElectrical Fault Detection and Protection