Development of the NIST X-ray Photoelectron Spectroscopy (XPS) Database, Version 5
Angela Lee, C. J. Powell, Justin M. Gorham, Adam Morey, John Henry J. Scott, R. J. Hanisch
Abstract
It has been over 20 years since the National Institute of Standards and Technology (NIST) launched the first web version of its X-ray Photoelectron Spectroscopy (XPS) database (Lee et al., 2002; Wagner, 1991) which has approximately 1000 active users every day. This database was recently redesigned to meet NIST security requirements and to include new features and enhancements. The new application is built upon a relational database using a cross-platform and open-source framework (Henning et al., 2002). In addition to a modern design interface, the new features include custom-built components for displaying formatted molecular formulas and spectral lines, for sorting spectral lines, and for graphical display of chemical shifts of binding energies, Auger-electron kinetic energies, and Auger parameters for elements in different compounds.