New reliability indices for first- and second-order discrete-time aggregated semi-Markov systems with an application to TT&C system
He Yi, Lirong Cui, N. Balakrishnan
Topics & Concepts
Reliability (semiconductor)ImperfectBounded functionMarkov chainDiscrete time and continuous timeInterval (graph theory)Markov processMathematicsReliability engineeringMathematical optimizationState (computer science)Markov modelOrder (exchange)Applied mathematicsComputer scienceAlgorithmStatisticsEngineeringCombinatoricsFinancePower (physics)PhilosophyEconomicsMathematical analysisLinguisticsPhysicsQuantum mechanicsReliability and Maintenance OptimizationAdvanced Battery Technologies ResearchSoftware Reliability and Analysis Research