Litcius/Paper detail

Binary Classifiers for Data Integrity Detection in Wearable IoT Edge Devices

Arlene John, Rajesh C. Panicker, Barry Cardiff, Yong Lian, Deepu John

2020IEEE Open Journal of Circuits and Systems19 citationsDOIOpen Access PDF

Abstract

This paper presents a comparison of several artificial intelligence (AI) based binary classifiers for detecting the integrity of data obtained from Internet of Things (IoT) enabled wearable sensors. Detecting the integrity of data at the network edge facilitates the elimination of corrupted or unusable data, which translates to a lower amount of data stored and transmitted. This reduces the storage and power requirements of IoT devices without a reduction in functionality. In this work, we explore several machine learning-based classifiers to check the integrity of electrocardiogram (ECG) data. The feature vectors are derived from low complexity kurtosis and skewness based Signal Quality Indices (SQIs). From the experiments, it is found that a bagged ensemble of 3 neural networks achieves the highest detection accuracy of 99.47%. We also estimated the complexity and power consumed by the various classifier implementations and classifier fusion implementations. The energy consumed by the ensemble classifier was estimated to be around 0.039 nJ.

Topics & Concepts

Computer scienceClassifier (UML)Wearable computerArtificial intelligenceInternet of ThingsKurtosisData miningPattern recognition (psychology)Wearable technologyImplementationMachine learningEmbedded systemProgramming languageStatisticsMathematicsECG Monitoring and AnalysisEEG and Brain-Computer InterfacesNon-Invasive Vital Sign Monitoring