Impact of heavy ion energy and species on single-event upset in commercial floating gate cells
Bing Ye, Lihua Mo, Pengfei Zhai, Li Cai, Tao Liu, Yanan Yin, You-Mei Sun, Jie Liu
Topics & Concepts
Linear energy transferSingle event upsetNAND gateIonUpsetHeavy ionFlash (photography)Ion trackEnergy (signal processing)Event (particle physics)Atomic physicsSensitivity (control systems)RadiationIrradiationNuclear physicsPhysicsElectrical engineeringLogic gateElectronic engineeringOpticsStatic random-access memoryEngineeringAstrophysicsMechanical engineeringQuantum mechanicsRadiation Effects in ElectronicsSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis