Recent Applications of X-ray Absorption Spectroscopy in Combination with High Energy Resolution Fluorescence Detection
Hiroyuki Asakura, Tsunehiro Tanaka
Abstract
X-ray absorption spectroscopy (XAS) has grown as one of the essential tools to analyze electronic and geometric structure of a target element in chemistry over the course of a half-century. X-ray emission spectroscopy (XES) has also widened its appeal for decades by the virtue of advance of X-ray sources and optics. Advanced X-ray spectroscopies in combination of XAS and XES such as high-energy resolution fluorescence detection (HERFD) XAS afford a new opportunity for enhanced local electronic and geometric analysis for chemists. In this highlight review, we present a brief introduction to XAS/XES, their related techniques, applications, and beamlines in Japan. X-ray absorption and emission spectroscopy (XAS/XES) have grown as one of the essential tools for decades. In this highlight review, we describe introduction of XAS/XES, high energy resolution fluorescence detection (HERFD) XAS and resonant inelastic X-ray scattering (RIXS) which afford further understanding of electronic and geometric structure analysis for chemists.