Using amplitude modulation of the microwave field to improve the sensitivity of Rydberg-atom based microwave electrometry
Xiubin Liu, Feng-Dong Jia, Huaiyu Zhang, Jiong Mei, Yonghong Yu, Wei-Chen Liang, Jian Zhang, Feng Xie, Zhi-Ping Zhong
Abstract
The microwave (MW) field can be measured by the Autler–Townes (AT) splitting of the electromagnetically induced transparency (EIT) spectrum in the Rydberg atomic system; however, the EIT-AT splitting method fails in weak MW fields. We used the amplitude modulation of the MW field to resolve the EIT-AT splitting in weak MW fields. The EIT-AT splitting interval can be directly obtained, and the minimum detectable MW strength is improved by six times compared with the traditional EIT-AT splitting method. The proposed method is more intuitive and convenient for measuring the strength of weak MW fields in practical applications.
Topics & Concepts
Electromagnetically induced transparencyMicrowavePhysicsAmplitudeAtomic physicsRydberg atomRydberg formulaField (mathematics)Atom (system on chip)Amplitude modulationFrequency modulationOpticsRadio frequencyQuantum mechanicsIonizationTelecommunicationsIonEmbedded systemComputer scienceMathematicsPure mathematicsQuantum optics and atomic interactionsCold Atom Physics and Bose-Einstein CondensatesAtomic and Subatomic Physics Research