Enhanced electrical properties by AC poling of relaxor-Pb(Zr,Ti)O<sub>3</sub> single crystals manufactured by the solid state crystal growth method
Yohachi Yamashita, Haiyang Sun, X. D. Yu, Hiroshi Maiwa, Ho-Yong Lee, Hwang-Pill Kim, Xiaoning Jiang
Abstract
Abstract An exceptionally large free dielectric permittivity of 14200, piezoelectric coefficient ( d 33 ) of 4800 pC/N and calculated electromechanical coupling factor k 33 of 95.7% were obtained from Pb(Mg 1/3 Nb 2/3 )O 3 (PMN) - Pb(Zr,Ti)O 3 (PZT) single crystals (SCs) under AC poling (ACP). The PMN −0.3PZT SCs grown by a solid-state crystal growth (SSCG) method with high composition uniformity showed a phase change temperature of 57 °C–72 °C and Curie temperature T c of 140 °C. The measured d 33 of 250 pC/N was obtained after a heat treatment at 250 °C, which is 110 °C higher than the T c of the SC. Microstructural observations revealed that the ACP SC showed a different 109° domain wall layers morphology due to the presence of some pores, which is dissimilar to the Bridgman ACP relaxor-PbTiO 3 SCs. These outstanding piezoelectric properties, heat durability, lower acoustic impedance, and better machinability of ACP SSCG SCs are promising for future piezoelectric device applications.