Volta potential mapping of the gradient strengthened layer in 20CrMnTi by using SKPFM
Tao Cheng, Wei Shi, Song Xiang, Ronald G. Ballingerc
Topics & Concepts
Materials scienceKelvin probe force microscopeElectron backscatter diffractionDeformation (meteorology)DislocationSolid mechanicsTransmission electron microscopyWork functionResidual stressVolta potentialStress (linguistics)Layer (electronics)Ultimate tensile strengthComposite materialCondensed matter physicsMicrostructureNanotechnologyAtomic force microscopyPhysicsLinguisticsPhilosophySurface Treatment and Residual StressMicrostructure and mechanical propertiesAdvanced Surface Polishing Techniques