Entanglement-enhanced quantum metrology: From standard quantum limit to Heisenberg limit
Jiahao Huang, Min Zhuang, Chaohong Lee
Abstract
Entanglement-enhanced quantum metrology explores the utilization of quantum entanglement to enhance measurement precision. When particles in a probe are prepared into a suitable quantum entangled state, they may collectively accumulate information about the physical quantity to be measured, leading to an improvement in measurement precision beyond the standard quantum limit and approaching the Heisenberg limit. The rapid advancement of techniques for quantum manipulation and detection has enabled the generation, manipulation, and detection of multi-particle entangled states in synthetic quantum systems such as cold atoms and trapped ions. This article aims to review and illustrate the fundamental principles and experimental progresses that demonstrate multi-particle entanglement for quantum metrology, as well as discuss the potential applications of entanglement-enhanced quantum sensors.