Study of Schottky barrier detectors based on a high quality 4H-SiC epitaxial layer with different thickness
Bohumír Zaťko, L. Hrubčín, Andrea Šagátová, J. Osvald, P. Boháček, Eva Kováčová, Yuriy Halahovets, S. Rozov, V.G. Sandukovskij
Topics & Concepts
Schottky barrierOhmic contactMaterials scienceDetectorOptoelectronicsEpitaxySchottky diodeEquivalent series resistanceFull width at half maximumMetal–semiconductor junctionDepletion regionLayer (electronics)VoltageAnalytical Chemistry (journal)OpticsChemistryNanotechnologySemiconductorPhysicsChromatographyDiodeQuantum mechanicsSemiconductor materials and interfacesSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devices