Litcius/Paper detail

Multilayer Grad-CAM: An effective tool towards explainable deep neural networks for intelligent fault diagnosis

Sinan Li, Tianfu Li, Chuang Sun, Ruqiang Yan, Xuefeng Chen

2023Journal of Manufacturing Systems109 citationsDOI

Topics & Concepts

Artificial intelligenceFault (geology)Convolutional neural networkArtificial neural networkDomain (mathematical analysis)Computer scienceDeep neural networksFeature (linguistics)Convolution (computer science)TrustworthinessDeep learningPattern recognition (psychology)MathematicsGeologySeismologyPhilosophyLinguisticsComputer securityMathematical analysisExplainable Artificial Intelligence (XAI)Machine Fault Diagnosis TechniquesImbalanced Data Classification Techniques
Multilayer Grad-CAM: An effective tool towards explainable deep neural networks for intelligent fault diagnosis | Litcius