Full-field deformation measurements in the transmission electron microscope using digital image correlation and particle tracking
Y. Zhang, Lin Feng, Shen J. Dillon, John Lambros
Topics & Concepts
Digital image correlationMaterials scienceFocused ion beamMicroscale chemistryDeformation (meteorology)OpticsTransmission electron microscopyTracking (education)MicroscopyComposite materialNanotechnologyIonMathematicsPhysicsPsychologyPedagogyMathematics educationQuantum mechanicsOptical measurement and interference techniquesForce Microscopy Techniques and ApplicationsNear-Field Optical Microscopy