In situ transmission electron microscopy studies of 30 keV H2+ and He+ dual-beam irradiated Pd: defect generation and microstructural evolution under varied temperatures and foil thicknesses
Xiang Yang Liu, Yipeng Li, Guang Ran, Qing Han, P.H. Chen
Topics & Concepts
Materials scienceFOIL methodTransmission electron microscopyIrradiationIn situCathode rayBeam (structure)Electron beam processingElectronAtomic physicsOpticsNuclear physicsNanotechnologyComposite materialMeteorologyPhysicsFusion materials and technologiesNuclear Materials and PropertiesAdvanced materials and composites