Bivariate Step-Stress Accelerated Life Tests for the Kavya–Manoharan Exponentiated Weibull Model under Progressive Censoring with Applications
Naif Alotaibi, Ibrahim Elbatal, Ehab M. Almetwally, Salem A. Alyami, A. S. Al-Moisheer, Mohammed Elgarhy
Abstract
A new three-parameter survival model is proposed using the Kavya–Manoharan (KM) transformation family and the exponentiated Weibull (EW) distribution. The shapes of the pdf for the new model can be asymmetric and symmetric shapes, such as unimodal, decreasing, right-skewed and symmetric. In addition, the shapes of the hrf for the suggested model can be increasing, decreasing, constant and J-shaped. Statistical properties are obtained: quantile function, mode, moments, incomplete moments, residual life time, reversed residual life time, probability weighted moments, order statistics and entropy. We discuss the maximum likelihood estimation for the model. The relevance and flexibility of the model are demonstrated using two real datasets. The distribution is very flexible, and it outperforms many known distributions, such as the three-parameter exponentiated Weibull, the modified Weibull model, the Kavya–Manoharan Weibull, the extended Weibull, the odd Weibull inverse Topp–Leone and the extended odd Weibull inverse Nadarajah–Haghigh model. A bivariate step-stress accelerated life test based on progressive type-I censoring (PTIC) using the model is presented. This pattern is noticed when a particular number of lifetime test units are routinely eliminated from the test at the conclusion of each post-test period of time. Minimizing the asymptotic variance of the MLE of the log of the scale parameter at design stress under PTIC yields an expression for the ideal test plan under PTIC.