System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method
Mesfin Seid Ibrahim, Jiajie Fan, Winco K.C. Yung, Jing Zhou, Xuejun Fan, W.D. van Driel, Guoqi Zhang
Topics & Concepts
Reliability engineeringReliability (semiconductor)Bayesian networkFault tree analysisWeibull distributionLED lampProcess (computing)Computer sciencePower (physics)EngineeringMachine learningMathematicsStatisticsElectrical engineeringQuantum mechanicsOperating systemPhysicsReliability and Maintenance OptimizationEngineering Applied ResearchGaN-based semiconductor devices and materials