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Label-Free Imaging of Single Proteins and Binding Kinetics Using Total Internal Reflection-Based Evanescent Scattering Microscopy

Pengfei Zhang, Rui Wang, Zijian Wan, Xinyu Zhou, Guangzhong Ma, Jayeeta Kolay, Jiapei Jiang, Shaopeng Wang

2022Analytical Chemistry30 citationsDOIOpen Access PDF

Abstract

Single-molecule detection can push beyond ensemble averages and reveal the statistical distributions of molecular properties. Measuring the binding kinetics of single proteins also represents one of the critical and challenging tasks in protein analysis. Here, we report total internal reflection-based evanescent scattering microscopy with label-free single-protein detection capability. Total internal reflection is employed to excite the evanescent field to enhance light-analyte interaction and reduce environmental noise. As a result, the system provides wide-field imaging capability and allows excitation and observation using one objective. In addition, this system quantifies protein binding kinetics by simultaneously counting the binding of individual molecules and recording their binding sites with nanometer precision, providing a digital method to measure binding kinetics with high spatiotemporal resolution. This approach does not employ specially designed microspheres or nanomaterials and may pave a way for label-free single-protein analysis in conventional microscopy.

Topics & Concepts

Total internal reflection fluorescence microscopeChemistryMicroscopyTotal internal reflectionKineticsMolecular bindingAnalyteReflection (computer programming)ScatteringReceptor–ligand kineticsNanotechnologyEvanescent waveBiological systemOpticsAnalytical Chemistry (journal)MoleculeMaterials scienceChromatographyPhysicsComputer scienceReceptorBiochemistryQuantum mechanicsOrganic chemistryProgramming languageBiologyAdvanced Biosensing Techniques and ApplicationsAdvanced biosensing and bioanalysis techniquesPlasmonic and Surface Plasmon Research
Label-Free Imaging of Single Proteins and Binding Kinetics Using Total Internal Reflection-Based Evanescent Scattering Microscopy | Litcius