Analysis of strain and disordering kinetics based on combined RBS-channeling and X-ray diffraction atomic-scale modelling
Xin Jin, Alexandre Boulle, Alain Chartier, Jean-Paul Crocombette, A. Debelle
Topics & Concepts
ChannellingRutherford backscattering spectrometryMaterials scienceMicroelectronicsDiffractionAtomic unitsScale (ratio)Computational physicsRadiative transferMultiscale modelingIonNanotechnologyOpticsPhysicsThin filmComputational chemistryChemistryQuantum mechanicsNuclear Materials and PropertiesFusion materials and technologiesNuclear materials and radiation effects