SIDEST: A sample-free framework for crop field boundary delineation by integrating super-resolution image reconstruction and dual edge-corrected Segment Anything model
Haoran Sun, Zhijian Wei, Weiguo Yu, Gaoxiang Yang, Junnan She, Hengbiao Zheng, Chongya Jiang, Xia Yao, Yan Zhu, Weixing Cao, Tao Cheng, Iftikhar Ali
Topics & Concepts
Sample (material)Enhanced Data Rates for GSM EvolutionArtificial intelligenceComputer visionDual (grammatical number)Boundary (topology)Field (mathematics)Image (mathematics)Computer scienceMathematicsPhysicsMathematical analysisLiteratureArtThermodynamicsPure mathematicsRemote Sensing in AgricultureAdvanced Image Processing TechniquesSmart Agriculture and AI