Reliability improvement of self-heating effect, hot-carrier injection, and on-current variation by electrical/thermal co-design
Young Suh Song, Ki Yeong Kim, Tae Young Yoon, Seok Jung Kang, Garam Kim, Sangwan Kim, Jang Hyun Kim
Topics & Concepts
MOSFETMaterials scienceReliability (semiconductor)Heat sinkOptoelectronicsTransistorThermalField-effect transistorDopingHot-carrier injectionElectronic engineeringEngineering physicsElectrical engineeringVoltageEngineeringThermodynamicsPhysicsPower (physics)Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor Technologies