Litcius/Paper detail

Fault detection and identification using Bayesian recurrent neural networks

Weike Sun, António R. C. Paiva, Peng Xu, Anantha Sundaram, Richard D. Braatz

2020Computers & Chemical Engineering144 citationsDOIOpen Access PDF

Topics & Concepts

Fault detection and isolationBenchmark (surveying)Identification (biology)Artificial neural networkFault (geology)Process (computing)Computer sciencePrincipal component analysisProbabilistic logicArtificial intelligenceBayesian probabilityData miningMachine learningEngineeringOperating systemActuatorGeographyBotanySeismologyBiologyGeologyGeodesyFault Detection and Control SystemsMineral Processing and GrindingSpectroscopy and Chemometric Analyses