Remaining useful life prediction for degradation with recovery phenomenon based on uncertain process
Sen-Ju Zhang, Rui Kang, Yan‐Hui Lin
Topics & Concepts
Degradation (telecommunications)PhenomenonProcess (computing)Computer scienceSimilarity (geometry)Uncertainty quantificationData miningArtificial intelligenceMachine learningTelecommunicationsImage (mathematics)Operating systemQuantum mechanicsPhysicsReliability and Maintenance OptimizationAdvanced Battery Technologies ResearchSoftware Reliability and Analysis Research