Litcius/Paper detail

Enhancing supervised bug localization with metadata and stack-trace

Yaojing Wang, Yuan Yao, Hanghang Tong, Xuan Huo, Ming Li, Feng Xu, Jian Lü

2020Knowledge and Information Systems19 citationsDOI

Topics & Concepts

Computer scienceTRACE (psycholinguistics)MetadataTask (project management)Information retrievalProcess (computing)Data miningKey (lock)Stack (abstract data type)SoftwareWorld Wide WebProgramming languageManagementComputer securityPhilosophyLinguisticsEconomicsSoftware Engineering ResearchAdvanced Malware Detection TechniquesScientific Computing and Data Management
Enhancing supervised bug localization with metadata and stack-trace | Litcius