Correlation approach for quality assurance of additive manufactured parts based on optical metrology
Xiao Zhang, Yi Zheng, Vignesh Suresh, Shaodong Wang, Qing Li, Beiwen Li, Hantang Qin
Topics & Concepts
MetrologyQuality assurancePoint cloudSurface roughnessReliability (semiconductor)Statistical process controlFootprintComputer scienceData miningMaterials scienceProcess (computing)Artificial intelligenceEngineeringStatisticsMathematicsPaleontologyOperations managementBiologyOperating systemPhysicsComposite materialExternal quality assessmentQuantum mechanicsPower (physics)Surface Roughness and Optical MeasurementsAdvanced Measurement and Metrology TechniquesAdditive Manufacturing Materials and Processes