Micro/Nano Engineering Advances Next-Generation Flexible X-ray Detectors
Xiangyu Ou, Zhongzhu Hong, Qinxia Wu, Xiaofeng Chen, Lili Xie, Zhenzhen Zhang, He Yu, Qiushui Chen, Huanghao Yang
Abstract
The growing demands for X-ray imaging applications impose diverse and stringent requirements on advanced X-ray detectors. Among these, flexibility stands out as the most expected characteristic for next-generation X-ray detectors. Flexible X-ray detectors can spatially conform to nonflat surfaces, substantially improving the imaging resolution, reducing the X-ray exposure dosage, and enabling extended application opportunities that are hardly achievable by conventional rigid flat-panel detectors. Over the past years, indirect- and direct-conversion flexible X-ray detectors have made marvelous achievements. In particular, microscale and nanoscale engineering technologies play a pivotal role in defining the optical, electrical, and mechanical properties of flexible X-ray detectors. In this Perspective, we spotlight recent landmark advancements in flexible X-ray detectors from the aspects of micro/nano engineering strategies, which are broadly categorized into two prevailing modalities: materials-in-substrate and materials-on-substrate. We also discuss existing challenges hindering the development of flexible X-ray detectors, as well as prospective research opportunities to mitigate these issues.