Surface defect detection of planar optical components based on OPT-YOLO
Junpeng Huang, Wang Zhang, Weilong Jin, Haili Hu
Topics & Concepts
PlanarComputer scienceSurface (topology)OpticsMaterials scienceOptoelectronicsComputer graphics (images)PhysicsGeometryMathematicsIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsAdvanced Measurement and Detection Methods