Stable field-emission from a CeB<sub>6</sub> nanoneedle point electron source
Shuai Tang, Jie Tang, Yimeng Wu, You-Hu Chen, Jun Uzuhashi, Tadakatsu Ohkubo, Lu‐Chang Qin
Abstract
A single CeB 6 nanoneedle structure has been fabricated using a focused ion beam (FIB) and it shows an excellent field emission current stability as well as a single emission spot.
Topics & Concepts
NanoneedleField electron emissionMaterials scienceWork functionCommon emitterRADIUSElectronAtomic physicsElectric fieldCathode rayCathodeRadius of curvatureOptoelectronicsNanotechnologyCurvaturePhysicsChemistryNanostructurePhysical chemistryQuantum mechanicsMean curvature flowComputer scienceMathematicsLayer (electronics)Mean curvatureComputer securityGeometryDiamond and Carbon-based Materials ResearchIon-surface interactions and analysisAdvanced Materials Characterization Techniques