Optimal design of step-stress accelerated degradation tests based on the Tweedie exponential dispersion process
Weian Yan, Xiaofan Xu, David Bigaud, Wenqin Cao
Topics & Concepts
Degradation (telecommunications)Stress (linguistics)Exponential functionTest planDispersion (optics)MathematicsProcess (computing)Mathematical optimizationApplied mathematicsComputer scienceStatisticsEngineeringMathematical analysisPhysicsElectronic engineeringWeibull distributionOperating systemLinguisticsOpticsPhilosophyReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsAdvanced Battery Technologies Research