Surface relaxation and photoelectric absorption effects on synchrotron X-ray topographic images of dislocations lying on the basal plane in off-axis 4H-SiC crystals
Tuerxun Ailihumaer, Hongyu Peng, Fumihiro Fujie, Balaji Raghothamachar, Michael Dudley, Shunta Harada, Toru Ujihara
Topics & Concepts
DiffractionDislocationSynchrotronOpticsMaterials sciencePenetration depthAbsorption (acoustics)Relaxation (psychology)Crystal (programming language)Photoelectric effectX-rayContrast (vision)Condensed matter physicsMolecular physicsCrystallographyPhysicsChemistryProgramming languagePsychologyComputer scienceSocial psychologyComposite materialSilicon Carbide Semiconductor TechnologiesSilicon and Solar Cell TechnologiesSemiconductor materials and interfaces