Edge computing-based unified condition monitoring system for process manufacturing
Hui Xiao, Wenshan Hu, Shuai Liu, Hong Zhou
Topics & Concepts
ExecutableEnhanced Data Rates for GSM EvolutionProcess (computing)Edge computingComputer scienceCondition monitoringReal-time computingInterface (matter)Embedded systemEngineeringOperating systemArtificial intelligenceBubbleMaximum bubble pressure methodElectrical engineeringIndustrial Vision Systems and Defect DetectionFault Detection and Control SystemsDigital Transformation in Industry