Channeled spectroscopic ellipsometry enabled by physics-informed tandem untrained neural networks
Shilong Yang, Xiuguo Chen, Wenlong Chen, Jing Hu, Yifu Wang, Shuo Liu, Shiyuan Liu
Topics & Concepts
TandemEllipsometryArtificial neural networkMaterials sciencePhysicsComputer scienceNanotechnologyArtificial intelligenceThin filmComposite materialOptical Polarization and EllipsometryRemote Sensing in AgricultureSpectroscopy and Quantum Chemical Studies