How microstructures, oxide layers, and charge transfer reactions influence double layer capacitances. Part 1: impedance spectroscopy and cyclic voltammetry to estimate electrochemically active surface areas (ECSAs)
Maximilian Schalenbach, Victor Selmert, Ansgar Kretzschmar, L.H.J. Raijmakers, Yasin Emre Durmus, Hermann Tempel, Rüdiger‐A. Eichel
Abstract
. Resistively damped currents in microstructures and low-conducting oxide layers are shown to complicate trustworthy capacitance-based estimations of ECSAs. In the second part of this study, advanced equivalent circuits models to describe the measured EIS and CV responses are presented.
Topics & Concepts
Dielectric spectroscopyCyclic voltammetryCapacitanceDouble-layer capacitanceResistive touchscreenElectrodeOxideElectrical impedanceElectrochemistryMaterials scienceLayer (electronics)Analytical Chemistry (journal)Double layer (biology)Displacement (psychology)ChemistryIonNanotechnologyElectrical engineeringPhysical chemistryEngineeringMetallurgyOrganic chemistryPsychotherapistPsychologyChromatographyElectrochemical Analysis and ApplicationsAnalytical Chemistry and SensorsConducting polymers and applications