Semi-supervised multi-scale attention-aware graph convolution network for intelligent fault diagnosis of machine under extremely-limited labeled samples
Zongliang Xie, Jinglong Chen, Yong Feng, Shuilong He
Topics & Concepts
GraphPattern recognition (psychology)Computer scienceClassifier (UML)Labeled dataData miningArtificial intelligenceSemi-supervised learningConvolution (computer science)Scale (ratio)Feature (linguistics)Artificial neural networkTheoretical computer scienceLinguisticsPhilosophyPhysicsQuantum mechanicsMachine Fault Diagnosis TechniquesIndustrial Vision Systems and Defect DetectionMachine Learning in Bioinformatics